iNEMI Conducts Fine Circuit Pattern Substrates Survey

iNEMI Conducts Fine Circuit Pattern Substrates Survey

Publish Date:2016-10-07 13:17:09 Clicks: 28

HERNDON, VA – iNEMI is conducting an industry survey to assess the measurement and inspection capability for fine circuit pattern substrates used in high bandwidth applications.

iNEMI requests help identifying key issues in fine pitch circuit pattern inspection/metrology and plans to make recommendations in this area relative to product requirements and process/material capabilities needed to close a technical gap.

Only aggregated data will be reported from this survey. No personal or company data will be included in the final report.



Copyright 2009-2024 All Rights Reserved by NOD Electronics
Building A01 & C03, Ping’an Silicon Valley, Zengcheng District, Guangzhou 511399, China
Powered by MetInfo 7.2.0 ©2008-2024