• The Use of Six Sigma with High- and Low-Volume Products and Processes

    21-08-2017

    The Use of Six Sigma with High- and Low-Volume Products and Processes

    One of the concerns about using six sigma is the volume of production. There are two parts to this concern. The immediate reaction is that the 3.4 PPM defect rate associated with six sigma might imply...
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  • Bad and Good Test Effectiveness

    21-08-2017

    Bad and Good Test Effectiveness

    Bad and good test effectiveness values are the percentage of PCBs that are properly distinguished as bad or good. This measure differs from test coverage, which is determined by the percentage of defe...
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  • What is Test Coverage?

    21-08-2017

    What is Test Coverage?

    Test coverage (also called defect coverage) is a measure of the ability of a tester to detect defects. It is the percentage of those defects that are “covered” by a test,with 100% representing test co...
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  • In-Circuit Test Effectiveness

    21-08-2017

    In-Circuit Test Effectiveness

    In the previous section, the in-circuit test was deemed the most important for achieving the six sigma level. As shown in Table 4.8, significant savings in cost could be achieved if this test method c...
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  • PCB Test Strategy Example

    19-08-2017

    PCB Test Strategy Example

    Atypical PCB test method comparison is given in Table 4.5. It can be seen that the test time increases with the complexity of the test per- formed. More complicated tests allow for a higher removal of...
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  • PCB Test Strategy for PCB Assemblies

    19-08-2017

    PCB Test Strategy for PCB Assemblies

    Figure 4.5 is an example of the test methodologies available for PCB assemblies. These methodologies can be summarized as follows:1. Visual test and inspection. These tests use trained operators to in...
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  • Determining Overall Product Testing Strategy

    19-08-2017

    Determining Overall Product Testing Strategy

    Ultimately, all defects have to be removed by testing the individual assemblies that make up the product, and then finally testing the product. Test engineers are concerned about the yield of the prod...
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  • Example And Discussion Of Implied Cpk in IC Assembly Line Defect Projections

    19-08-2017

    Example And Discussion Of Implied Cpk in IC Assembly Line Defect Projections

    Figure 4.4 is an example of a portion of an IC fabrication line. Only a few operations are shown in order to demonstrate the utility of using Cpk-based analysis for the line. This analysis can be used...
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