• Determining Design or Manufacturing Yield on Multiple Parts with Multiple Manufacturing

    19-08-2017

    Determining Design or Manufacturing Yield on Multiple Parts with Multiple Manufacturing

    Operations or Design SpecificationsA typical production line consists of multiple sources of materials and multiple distinct operations for fabrication and assembly of parts into the next-higher level...
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  • PCB Yield Example

    17-08-2017

    PCB Yield Example

    A product contains 10 PCBs, and a goal of 95% turn on yield was 3et for each PCB at in-circuit test (ICT). The product final test turn-on yield will be as follows:A turn-on yield of 61% is disappointi...
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  • Determining Assembly Yield and PCB and Product Test Levels in Electronic Products

    17-08-2017

    Determining Assembly Yield and PCB and Product Test Levels in Electronic Products

    In typical electronic manufacturing lines, printed circuit boards (PCBs) are assembled and tested individually. Multiple PCBs are then assembled into finished products, which are tested. The test engi...
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  • Example of Calculating Yield in A Part with Multiple Operations

    17-08-2017

    Example of Calculating Yield in A Part with Multiple Operations

    In Figure 4.1, the wire bonding of an IC is shown. The chip is centered in the middle of the IC package frame, and wires are bonded from the chip to the frame. There are two bonds per IC termination....
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  • Determining Manufacturing Yield on a Single Operation or a Part with Multiple Similar Operations

    17-08-2017

    Determining Manufacturing Yield on a Single Operation or a Part with Multiple Similar Operations

    The manufacturing yield determination is based on the definition of the probability of obtaining a defect. The FTY is the percentage number of units produced without defects, prior to test or inspecti...
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  • Determining Units of Defects

    17-08-2017

    Determining Units of Defects

    The basic definition of a defect is one that is based on the Poisson distribution. The defect rate, or defects per unit (DPU), is calculated based on defects, opportunities, and units. Defects are any...
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  • The Use of Six Sigma in Determining the Manufacturing Yield and Test Strategy

    17-08-2017

    The Use of Six Sigma in Determining the Manufacturing Yield and Test Strategy

    Manufacturing is a multistep process, with each step generating its own variability, and therefore contributing to the overall defect rate. In a large multistep operation, individual process quality h...
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  • What is Scatter Diagrams?

    17-08-2017

    What is Scatter Diagrams?

    Scatter diagrams are simple graphical methods used to study relationships between two variables. They can quickly determine if a relationship exists (positive or negative) and the strength of that rel...
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