In Figure 4.1, the wire bonding of an IC is shown. The chip is centered in the middle of the IC package frame, and wires are bonded from the chip to the frame. There are two bonds per IC termination....

The manufacturing yield determination is based on the definition of the probability of obtaining a defect. The FTY is the percentage number of units produced without defects, prior to test or inspecti...

The basic definition of a defect is one that is based on the Poisson distribution. The defect rate, or defects per unit (DPU), is calculated based on defects, opportunities, and units. Defects are any...

Manufacturing is a multistep process, with each step generating its own variability, and therefore contributing to the overall defect rate. In a large multistep operation, individual process quality h...

Scatter diagrams are simple graphical methods used to study relationships between two variables. They can quickly determine if a relationship exists (positive or negative) and the strength of that rel...

Pareto charts have data plotted in bar graph form and display the number of times each defect has occurred, in ascending order. They plot the relative contribution of each defect cause, and tell at a ...

A flowchart is a picture of a process. It represents a step-by-step sequence. It can help in reaching a common understanding of how the manufacturing process is run and can act as a base for enhancing...

A checksheet is a form used to identify, gather organize, and evaluate data. A well-designed checksheet can eliminate confusion, enhance accuracy, and reduce time needed to take data.There are two typ...